IEC61032 Test Finger Probe a with 50n

Min.Order: 1
Product origin: Shenzhen, Guangdong, China
Infringement complaint: complaintComplaint
US$ 180 ~ 350

Description
IEC61032 test finger probe A with 50N

Model:BND-A/ BND-AF

Reference Standard:
IEC60529,IEC61032,IEC60335,IEC61029,IEC60745,IEC60065,IEC60950.
 
Application:
This probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.The handle is made of plastic and the ball is made of stainless steel.
 
Technical Parameter:
Ball diameter50mm
Baffle plate diameter45mm
Baffle plate thickness4mm
Handle diameter10mm
Handle length100mm
Materialplastic(delrin) + stainless steel
Reference StandardIEC61032 IEC60529 IEC60065 GB/T4208
 
*There are Two kinds of test probe A
one kind is test probe A without force BND-A
The another is test probe A with force BND-AF


The following Pictures are the test probe A withour force:BND-A




The following pictures are the BND-AF test probe A with 50N force:



 

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