Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing

PCT High Pressure Accelerated Aging Test Mahcine for Semi Conductor Reliability Testing

Product description

The purpose of the Highly Accelerated Aging Test (HAST) is to increase product environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. , The reliability of semiconductor products has improved. At present, most electronic devices can withstand long-term high temperature and high humidity deviation tests without failure. Therefore, the test time used to determine the quality of the finished product has also increased a lot. In the design stage of the product, it is used to quickly expose the defects and weaknesses of the product, and test the sealing and aging performance of its products.

Volume and dimension

The main technical parameters

Features:
The industry's first application of fluid simulation design technology and product process manufacturing technology, the product is more energy-efficient.
The inner tank adopts a double-layer arc design, which can prevent the phenomenon of condensation and dripping in the test, so as to avoid the direct impact of the superheated steam on the product in the test process and affect the test result.
Fully automatic water replenishment function, front-mounted water level confirmation.
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