Smu Factory High Precise Smu with Wide Test Range Source Measure Unit Sensor Characteristic Test Source Instrument Meter Keithley 2410 Replacement

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Product origin: Wuhan, Hubei, China
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US$ -1

Description
 Smu Factory High Precise Soure measure Meter with Wide Test Range Source Measure Unit Sensor Characteristic Test Instrument Sourcemeter Keithley 2410 Replacement
Introduction

 
Wuhan Precise Instrument Co.,Ltd has been creating S series source measure meter for so many years.
The source measure meter function has high-precision, large dynamic range, digital touch screen, four-quadrant operation, collect and test input & output voltage and current, meanwhile, maximum output voltage 300V, and minimum output current 100pA.
Therefore, it is widely used in electrical characteristics tests.
 





Characteristics


8 inch Touch Screen, graphical operation
LIV,PIV software quickly testing
High-accuracy at 0.1%
Four-quadrant operation, range: 100pA~1A , 0.3mV~300V
Various scanning modes, support linear, exponential and user-defined scanning
USB storage and export
Multiple communication interfaces RS-232/GPIB/LAN


Technical Parameters
Max output power30w,
four quadrant source or sink operation
Source/sink limits±30V (≤1A), ±300V (≤100mA),
±1.05A (≤30V), ±105mA (≤300V)
Overrange 105% of range, source and measure
On-load capacitance<22nF
Noise (20MHz)2mV RMS, <20mV Vp-p
Voltage guard Output impedance 1 kΩ, Deflection-Voltage<80mV
Max sampling rate1000 sample/s
TriggerI/O
Communication InterfaceRS-232,GPIB
Power supplyAC100V~240V 50/60Hz
 Temperature coefficient25±10 ºC
Length,Width and Height425mm L x 255mm W x 106mm H
Weight5KG
Warranty1 year


Voltage and current accuracy: (Different models have different voltage and current ranges, please refer to the selection guide )
 
Voltage
 
Source
 
Measure
 
Range
 
Programming resolutionAccuracy±(% rdg.+ V)Programming resolutionAccuracy±(% rdg.+ A)
300mV30uV0.1%±300uV30uV0.1%±300uV
3V300uV0.1%±500uV300uV0.1%±500uV
30V3mV0.1%±3mV3mV0.1%±3mV
300V30mV0.1%±30mV30mV0.1%±30mV
Current
 
Source
 
Measure
 
Range
 
Programming resolutionAccuracy±(% rdg.+ V)Programming resolutionAccuracy±(% rdg.+ A)
100nA10pA0.1%±0.5nA10pA0.1%±0.5nA
1uA100pA0.1%±3nA100pA0.1%±3nA
10uA1nA0.1%±5nA1nA0.1%±5nA
100uA10nA0.1%±50nA10nA0.1%±50nA
1mA100nA0.1%±300nA100nA0.1%±300nA
10mA1uA0.1%±5uA1uA0.1%±5uA
100mA10uA0.1%±20uA10uA0.1%±20uA
1A100uA0.1%±2mA100uA0.1%±2mA



Source/Sink  Working Quadrant Diagram


                                S100                                                                  S200                                                               S300                              




Applications

Semiconductor device test: Resistance, Diode, Transistor, MOSFET, SiC, GaN, etc .
Energy and efficiency test: LED / AMOLED, Solar cells, DC-DC converters, etc .
Sensor characteristic test: Resistivity, Hall effect, etc .
Organic material test: Electronic ink, Printed electronic technology, etc .
Nanomaterial test: Graphene, Nanowires, etc .



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