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Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf
Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf
Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf
Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf
Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf
Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf

Dw-Np-5010 Energy Dispersion Xrf Metal Gold Testing Machine Alloy Analyzer Wed Xrf Energy Dispersive X Ray Fluorescence Analysis Xrf

Min.Order: 1
Product origin: Chongqing, China
Infringement complaint: complaintComplaint
US$ 16800 ~ 25988

Description
Product Description


Energy Dispersion X-ray Fluorescence Spectrometer
(DW-NP-5010)
 

Working principle
The original X-ray produced by X-ray tube and high voltage is irradiated on the sample after being properly filtered by the optical filter. The characteristic X-ray (called X-ray fluorescence) of the elements contained in the sample is stimulated. X-ray fluorescence spectra were obtained by using X-ray detectors with high energy resolution. Different elements formed different spectral peaks on the spectra.The strength of the spectral peak is directly proportional to the content of elements in the sample. The energy spectrum detected by the detector is analyzed by the computer. The types of elements contained in the sample are qualitatively analyzed by the position and shape of the spectral peak.
Application
DW-NP-5010A energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.
Main component and technical parameters
1.Si(PIN) or SDD detectorThe resolution of detector is one of the main indexes to evaluate the performance of energy dispersive XRF spectrometer.

Resolution<  145eV (The lower the resolution, the higher the sensitivity.)
Counting rate>  1000/S
Crystal area>  15mm2
Beryllium window thickness  =  0.025mm
Detector power<  1.2W

2.  Multi-channel analyzer
Number of channels: 2048 channels
 
3.Power controllerSystem power control: +5 VDC at 250 mA (1.2 W)
Constant cooling control: 400 VDC

4.  X ray tube
The X-ray tube, specially treated with embedded lead inside is shielded in full range, leaving only the side window for the x ray outlet. The canned insulating oil is used for high voltage insulation and cooling, 0.005 inch Beryllium window, rated consumption power 50W, rated power 50kV. Designed service life >15000h.

5.  High voltage generator
Input:  85~265VAC,47~63Hz,Power factor correction.
1kV~5kVcomply to UL85~250VAC input standard

Voltage variation: 0.01% of output voltage from no load to full load

Current variation: 0~rated power, 0.01% of output current

Ripple: Peak - peak of output voltage 0.25%

Temperature variation: voltage or current setting, 0.01%/oC

Stability: 0.05%/8h after warming-up for half an hour

6.  Automatic filter conversion system
Filters are automatically selected and converted(filter function:The energy spectrum component of the excitation line can be improved to suppress the strong X-ray fluorescence of high content components and improve the measurement accuracy of the elements to be measured.)

7.  Radiation shielded system
  • Newly designed and specially treatedX-ray tube with low-radiation
  • Fully enclosed lead plate double shield design
  • Automatic filtering device for lead plate
  • X - ray interrupters in case of sample unexpected cover opening
  • Delay testing and X-ray warning system

8.  The detection limit of harmful elements Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction
Detection limit (Cd,Pb,Cr,Hg,Br): 2ppm

9.  Powerful analysis software workstation

One-touch operation software, simple and easy to use, user does not need professional knowledge.

Ergonomic human-machine interface

Operators do not need to set various test parameters, powerful customized report function..

Test data is automatically stored with historical query function

The most advanced qualitative and quantitative analysis method.

Dozens of elements can be analyzed simultaneously.
10.  Technical parameter
ModelDW-NP-5010A
Analysis principleEnergy dispersive X-ray fluorescence analysis
Element measuring rangeAny element from Na(11)-U(92)
Min. measuring limitCd/Hg/Br/Cr/Pb≤2 ppm
Sample shapeArbitrary size, any irregular shape
Sample typePlastic/metal/film/powder/liquid etc
X ray tubeTarget materialMo
Tube voltage5─50KV
Tube current1─1000uA
Sample exposure diameter2, 5, 8mm
DetectorSi-PIN or SDD detector, high speed pulse height analysis system
High voltage generator Special HV generator for X fluorescence
ADC2048 channels
Filter 6 filters are automatically selected and converted.
Sample observation200×color CCDcamera
Analysis softwarePatented software products, free upgrade for life
Analysis methodTheoretical α coefficient method,basic parameter method, empirical coefficient method
Analysis time30-900seconds, adjustable
Operating system softwareWINDOWS XP
Dataprocessing systemHostPC business model
CPU≥2.8G
Memory≥2g
CD-ROM8xDVD
Hard disk≥500G
Display22'' or 24'' LCD display
Working environmentTemperature 10-35С,humidity 30-70%RH
 
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