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Dzdr-S Rapid Thermal Instrument, Transient Plane Source Technology Thermal Conductivity Tester
Product Introduction:
Based on the transient plane heat source method (
TPS) thermal conductivity tester.The product is independently developed by Achievo Instrument, testing performance
Stable, strong data processing and analysis ability, can be used for the measurement of thermal conductivity of various types of materials.
Dzdr-S Rapid Thermal Instrument, Transient Plane Source Technology Thermal Conductivity Tester
Measurement object:
Material type: metal, ceramic, alloy, ore, polymer, composite, paper, fabric, foam (flat surface insulation)
Thermal material, plate), polyurethane, phenolic, urine aldehyde, mineral wool (glass wool, rock wool, mineral wool), cement wall, glass
CRC strong composite board, cement polystyrene board, sandwich concrete, FRP panel composite board, paper honeycomb board, etc.
Dzdr-S Rapid Thermal Instrument, Transient Plane Source Technology Thermal Conductivity Tester
Technical parameters:
| Test range | 0.001-300W /(m*K) | Measuring temperature range | room temperature -- 130ºC |
| Probe diameter | no. 1 probe 7.5mm;No. 2 probe 15mm | Accuracy | 0.001 |
| Measurement time | 5~160 seconds | Power supply | AC 220V |
| machine power | < 500W8. Sample temperature rise :<15ºC | Test sample power P | no. 1 probe power 0<P<1 w;No. 2 probe power 0<P<20 w. |
| sample specifications | No. 1 probe sample (≥ 7.5*7.5*3.75mm) No. 2 probe sample (≥15*15*7.5mm) |
Dzdr-S Rapid Thermal Instrument, Transient Plane Source Technology Thermal Conductivity Tester
Note: No. 1 probe is used to measure low conductivity material with thin thickness.If the sample surface is smooth and sticky, the sample can be put into Line superposition
Dzdr-S Rapid Thermal Instrument, Transient Plane Source Technology Thermal Conductivity Tester
Instrument features:
Wide range of test, stable test performance, in the domestic similar instrument, in the leading level;
Direct measurement, test time about 5-160s can be set, can quickly and accurately measure the thermal conductivity, saving a lot of time;
It will not be affected by contact thermal resistance as the static method;
No special sample preparation, no special requirements for sample shape, block solid only need relatively smooth sample surface and full length and width at least twice the diameter of the probe;
Non-destructive testing of samples means that samples can be reused;
The probe adopts the double helix structure to design, combined with the exclusive mathematical model, using the core algorithm to analyze and calculate the data collected on the probe;
The structure design of the sample table is clever, easy to operate, suitable for placing samples of different thickness, and simple and beautiful;
Data acquisition on the probe using imported data acquisition chip, the high resolution of the chip, can make the test results more accurate and reliable;
The control system of the host uses THE ARM microprocessor, which is faster than the traditional microprocessor, improves the analysis and processing ability of the system, and makes the calculation results more accurate;
The instrument can be used for block solid, paste solid, granular solid, colloid, liquid, powder, coating, film, insulation materials and other thermal property parameters measurement;
Intelligent man-machine interface, color LCD display, touch screen control, easy and simple operation;
Strong data processing ability.Highly automated computer data communication and report processing system.
